Electrical Resistance Tomography was successfully applied for the first time for mapping the conductivity of metallic Nanowire Networks [1], which are emerging as efficient transparent conducting materials in several applications (touch screens, solar cells, and organic LED). For the task, the Electrical Resistance Tomography recently developed at INRIM [2], has been adapted to allow for non-invasive measurements of Nanowire Networks which are particularly sensitive to the applied voltage [3]. [more]
The M18 meeting will be hosted at INRiM premises in Turin, Italy on the 3rd and 4th of November. Follow the link for the Meetign Agenda and logistics details. [more]