A pEek on the lab

Physikalisch-Technische Bundesanstalt (Germany)

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LAB and RESEARCH

PTB-Lab at BESSY II

Beamlines and experimental endstation used for reference-free X-ray spectrometry experiments in the PTB laboratory at the synchrotron radiation facility BESSY II in Berlin.

View into the main experimental chamber used for reference-free X-ray spectrometry.

The Main Experimental Chamber

View into the experimental chamber for reference-free TXRF, GIXRF and XRF experiments in the PTB laboratory at the BESSY II electron storage ring.

PEOPLE and LIFE

Philipp Hönicke

Philipp Hönicke has obtained his PhD at TU Berlin employing grazing incidence based fluorescence spectroscopy for the characterization of nanolayered samples and he has more than 12 years of research experience.

Yves Kayser

Yves Kayser is a postdoc in the X-ray spectrometry group of the Physikalisch-Technische Bundesanstalt (PTB) since 2016. He received his Ph.D. in physics in 2011 from the University of Fribourg, where he worked on high-energy resolution grazing emission X-ray fluorescence (GEXRF).

Before joining the PTB, he has worked at the Swiss Light Source of the Paul Scherrer Institut focusing on grating-based X-ray wavefront metrology as well as X-ray emission spectroscopy at synchrotron radiation and X-ray free electron laser facilities.

André Wählisch

André Wählisch currently pursues his Ph.D. in physics with the X-ray spectrometry group of the Physikalisch-Technische Bundesanstalt (PTB) at the electron storage ring BESSY II.

Main focus of his research comprises the advancement of reference-free quantification approaches based on X-ray fluorescence analysis for sample objects at the nanoscale.

Burkhard Beckhoff

Burkhard Beckhoff is head of the X-ray spectrometry group of the Physikalisch-Technische Bundesanstalt (PTB) operating a beamline and several dedicated UHV instrumentations at the synchrotron radiation facility BESSY II.

The main work objective of the group is to establish traceable characterization techniques for advanced materials at both the nano- and microscales. Using calibrated instrumentation X-ray spectrometry allows for such elemental and species analysis in addition to complementary dimensional information.

Further works aim at the qualification of both operando analysis methods for batteries and calibration samples for external methods.